開催日と会場のご案内

2019/10/20（日）～25日（金）
Columbus, Ohio, USA 

公式サイト：https://www.avs.org/Symposium

PHI USAから発表、ブースを出展（#500）いたします。

Monday, Oct. 21, 10:40 AM, AS
- "Misinterpretations in the Spectroscopic Analysis of Heterogeneous Materials and Defected Structures", L. Swartz

Tuesday, Oct. 22, 2:00 PM, Exhibitor Talks
- "What’s New at PHI", J. Newman

Tuesday, Oct. 22, 5:00 PM, AS
- "Characterization of Electronic Materials using Low Energy Inverse Photoemission Spectroscopy", B. Schmidt

Thursday, Oct. 24, 8:40 AM, AS
- "TOF-SIMS Tandem MS Imaging of (Sub-)Monolayer Coatings for Device Processing", D.M.Carr 

Thursday, Oct. 24, 12:00 PM, AS
- "Multi-technique Surface Analysis of Graphenes", K. Artyushkova

Thursday Poster Session
- "Using AES, EDS, and FIB to Detect, Identify, and Image Buried Metallic Particles", A. Ellsworth

Thursday Poster Session
- "XPS, TOF-SIMS, and AES Analysis of Fresh and Aged Alumina-Supported Silver Catalysts", J. Newman