開催日と会場のご案内

2019/9/15（日）～20日（金）
Dresden, Germany 

公式サイト：http://www.ecasia2019.com/

≪当社およびPHI USAからの発表内容≫

Kazutoshi Mamiya - Monday, Sept. 16, 4:20 pm, Konferenz 2-3 (K 2-3) - Auger Electron Spectroscopy Analysis of Phase-change Memory Cells

Masahiro Terashima - Monday, Sept. 16, 4:40 pm, Konferenz 2-3 (K 2-3) - The Electronic Band Structure Analysis of OLED Device by Means of in-situ LEIPS and UPS combined with GCIB

Greg Fisher - Tuesday, Sept. 17, 1:50 pm, Konferenz 1 (K 1) - Visualization of Nanoscale Features and Structural Assessment of (sub-)monolayer Coatings in Devices by Tandem MS Imaging

Kateryna Artyushkova - Tuesday, Sept. 17, 4:00 pm, Hall 3 (Plenum) (H 3) - Multi-technique Surface Analysis of Graphenes

Katsumi Watanabe - Tuesday, Sept. 17, 5:40 pm, Hall 2 (H 2) - Measurements of Empirical Relative Sensitivity Factors in CrKα X-ray

Ben Schmidt - Tuesday, Sept. 17, 5:40 pm, Hall 2 (H 2) - New Analytical Options on PHI VersaProbe III XPS System for Characterization of Electronic Materials

Jennifer Mann - Tuesday, Sept. 17, 5:40 pm, Hall 2 (H 2) - Beyond the Surface: Design & Applications of a New Laboratory-Based Scanning XPS/HAXPES Instrument

Ashley Ellsworth - Thursday, Sept. 19, 5:40 pm - Using AES, EDS, and FIB to Detect, Identify, and Image Buried Metallic Particles

John Newman - Thursday, Sept. 19, 5:40 pm, Hall 2 (H 2) - XPS, TOF-SIMS, and AES Analysis of Fresh and Aged Alumina-Supported Silver Catalysts

ECASIAへお越しの際は、ぜひお立ち寄りください。