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What is Parallel Imaging MS/MS Option ?

2017.07.27 UpdateTOPICS

What is Parallel Imaging MS/MS Option ?

The parallel imaging MS/MS option available for TOF-SIMS achieves high-speed and high- sensitive tandem mass spectrometry of the outermost surface of a material, thereby enabling high-speed measurement of both MS1 and MS2 at the same time under static-SIMS conditions.

（＊US Patent　EP,JP Patent Pending）

Simultaneous Acquisition of Spectra and Images for MS1 and MS2

A precursor selector which can extract the specified secondary ions, enables high-speed parallel acquisition of MS1 and MS2. 

Since the MS1 measurement detects all components on the sample surface, the spectrum obtained tends to be complex. In contrast, the MS2 data would be a simple spectral pattern, allowing the imaging of specific molecular structures.

Precursor selector OFF

Precursor selector ON

Example of Measurement of Unknown Organic Material

This example shows the measurement of an unknown organic material.
Since the MS1 spectrum reflects all components on the sample surface, the spectrum could be complex. In contrast, simplified MS2 data allows us to obtain the detailed information on the chemical structure.

The Parallel imaging MS/MS Option Spectrum and Images.

Sample: Unknown (organic material)
Primary ion：30 keV Bi3+
Field of view: 400 μm × 400 μm
Acquisition time: 14 min.
Ion dose: 3.2 × 1011 ions/cm2 

Example of Measurement of an Unknown Additive on Propylene Surface

This example shows the measurement of unknown additives on a polypropylene surface. The MS/MS option allows high-sensitivity analysis of additives present only on the outermost surface, in addition to enabling visualization of the distribution of specific chemical structures. (Click to enlarge image.)

MS2 Spectrum and Images of the MS/MS OptionMS/MS Electrostatic analyzerMS1 Spectrum and Images of the MS/MS Option

Sample: Polypropylene containing multiple unknown additives
Primary ion：30 keV Bi3+
Field of view: 400 μm × 400 μm
Acquisition time: 8 min 
Ion dose: 7.6×1011 ions/cm2 

Note: In the text, the notations “MS1” and “MS2” correspond to the respective hardware  including detectors, while the notations “MS1” and “MS2” (with numbers in superscript) correspond to the respective TOF-SIMS data.

 

 

Time-of-Flight SIMS / TOF-SIMS