開催日と会場のご案内

2019/10/20（日）～25日（金）
みやこめっせ（京都） 

公式サイト：http://siss-sims.com/sims22/

≪当社およびPHI USAからの発表内容≫

Gregory Fisher - Wednesday, Oct. 23, 10:20 am, Room 4 (23-3-03)
- Structural assessment of (sub-)monolayer coatings in device processing at high spatial resolving power by TOF-SIMS tandem MS imaging

Shin-ichi Iida - Wednesday, Oct. 23, 3:00 pm, Room 2 (23-1-08)
- TOF-SIMS MS/MS depth profiling of OLED devices for elucidating the degradation process

Hsun-yun Chang - Wednesday, Oct. 23, 6:00 pm, Hall A (23-SP-42)
- Investigation of gas cluster ion beam for depth profiling of hybrid materials

Miyako Sekiya - Wednesday, Oct. 23, 6:00 pm, Hall A (23-SP-74)
- Fragmentation pattern of Fatty Acid Amides in TOF-SIMS with Tandem MS

Shin-ichi Iida - Wednesday, Oct. 23, 6:00 pm, Hall A (23-SP-82)
- Wider Vision Capability of Curved Surface Sample Holder for TOF-SIMS Imaging

Takuya Miyayama - Thursday, Oct. 24, 10:50 am, Room 3 (24-2-02)
- Bismuth attached intact molecular secondary ions [M+Bi]^+ under low-energy bismuth primary ion beam irradiation

SIMS-22 へご来場の際は、ぜひ当社発表、ブースへお越しください。