Event Report in JASIS 2016
2016.11.18 Update
Event Report in JASIS 2016
The annual JASIS exhibition was held at Makuhari Messe from September 7 to 9, 2016.
On exhibit at ULVAC-PHI’s booth were product line-ups including the following new systems and techniques:
- PHI VersaProbe III, ULVAC-PHI’s newly-released XPS system from the best-selling VersaProbe series
- PHI 4800, ULVAC-PHI’s user-friendly AES system
- In-laboratory HAXPES (PHI Quantes) Scanning Dual Monochromator X-ray source
- Parallel Imaging MS/MS option for the TOF-SIMS
ULVAC-PHI also gave presentations on the following as a part of the New Technology Presentation Programs:
- New XPS system and its applications
ULVAC-PHI’s new system, PHI 5000 VersaProbe III & on-going development project of the In-laboratory HAXPES system - Recent applications of high sensitivity and high energy resolution AES system
Features & applications of ULVAC-PHI’s high sensitivity & high energy resolution AES system, PHI 4800 - Recent Applications of TOF-SIMS equiped with parallel imaging MS/MS
PHI nanoTOF II's new option, the parallel imaging MS/MS enabling simultaneous acquisition of mass spectra and mass images of the same analysis area, using actual analysis data results